Used JEOL JSM 7401F #9229628 for sale

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JEOL JSM 7401F
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ID: 9229628
Field Emission Scanning Electron Microscope (FE-SEM) Cold cathode FEG with immersion lenses Bake-out board needs to be replaced Equipped with: OXFORD INCA 450 EDS With INCA feature (Particle analysis) and HKL channel 5 EBSD.
JEOL JSM 7401F is a scanning electron microscope (SEM), designed and manufactured by JEOL, that uses a beam of electrons to generate high resolution images of the surface of a specimen. The main component of the SEM is the electron gun, which consists of a filament that emits electrons, an anode and focusing elements that accelerate and focus the electrons into a beam. The beam is then directed onto the specimen and the reflected electrons are collected to form an image. JEOL JSM-7401F has a high quality electron column which can achieve stable performance during the imaging process. It also has an energy-dispersive spectroscopy (EDS) detector which can detect the energy of the electrons produced. The EDS detector enables the user to distinguish between the various elements present in a specimen and this is useful for materials analysis. JSM 7401 F has several features which make it suitable for both research and development applications. One of these features is the high resolution imaging (up to 0.5nm), which makes it possible to carry out detailed studies of both surfaces and inner structures. The SEM also has a low vacuum mode, which enables the user to operate at a lower vacuum level, allowing the examination of non-conductive materials at relatively fast speeds. In addition to the imaging capabilities, the SEM also has a feature known as variable pressure imaging. This enables the operating conditions to be changed from high vacuum to low vacuum levels and the electrons can then penetrate further into the sample before being reflected. JSM-7401F is also designed to be user-friendly. The SEM has a digital camera and a display which allows the user to easily monitor specimens during the scanning process. The SEM also has an automated stage, allowing for precise sample positioning and scanning. Overall, JEOL JSM 7401 F is a highly versatile scanning electron microscope which is suitable for a wide range of applications in electron microscopy, materials analysis and surface studies. It has excellent imaging capabilities and features which are designed to ensure efficient and reliable operation.
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