Used PHILIPS / FEI FIB 200 #293587354 for sale

PHILIPS / FEI FIB 200 is a dual-beam scanning electron microscope, a tool that provides high resolution imaging capabilities. The microscope is equipped with a variety of features that make it an essential tool for researchers in a variety of fields. The basic optical system is composed of a cathode ray source and a variety of lenses and controls that are used to focus and manipulate the beam of electrons. The microscope also features a focused ion beam (FIB): This device is able to directly manipulate capillaries, allowing for operations such as milling and drilling. The combination of the electron and ion beams on the same instrument enables it to achieve both high-resolution imaging and nanofabrication. The microscope itself has a maximum resolution of 0.8 nm, with a field of view of up to 4 mm. It is capable of operating at 30 kV to 30 kV and can be adjusted to a number of different operating modes. In addition, the instrument has an analytic system available for sample analysis, providing signals from secondary electrons, backscattered electrons, and X-rays. FEI FIB 200 is a versatile imaging instrument that is capable of producing consistent high-quality results. Its combination of electron- and ion-beam imaging capabilities, as well as its low power consumption and wide range of operating modes, make it an excellent choice for researchers. PHILIPS FIB-200 is an incredibly precise and reliable machine, offering the highest level of quality and accuracy.