Used PHILIPS / FEI FIB 200 for sale

Scanning Electron Microscopes

Manufacturer

PHILIPS / FEI

Model

FIB 200

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Focused Ion Beam (FIB) System Insulator Pt Carbon GIS XeF2.

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Focused Ion Beam (FIB) system With magnum column (3) GIS Units PC.

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Focused Ion Beam (FIB) system Ion column GIS Included.

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Focused Ion Beam (FIB) system.