Used PHILIPS / FEI FIB 200 #293676195 for sale

PHILIPS / FEI FIB 200 is a scanning electron microscope (SEM) that is a powerful platform for imaging at the nanoscale. It has excellent resolution and contrast, and provides a range of enhanced data analysis applications. FEI FIB 200 utilizes a focused ion beam (FIB) to remove small areas of the specimen and then scans the exposed area with an electron beam to observe the details of the specimen. This process combines the imaging capabilities of the SEM with advanced sample processing. PHILIPS FIB-200 has a variety of features that make it a great choice for research and industrial applications. This microscope has a scan range of 8nm to 50μm, an overall magnification range of 5x to 500x, and a variable spot size ranging from 1nm to 100nm. With its precise positioning stage, scientists can easily navigate to any area of interest. PHILIPS / FEI FIB-200 also offers superior image quality with its built-in SuperTwin E-Beam technology. This feature produces high quality images with excellent contrast. Additionally, FEI FIB-200 can be used to obtain the data needed to model 3D structures with the advanced 3D reconstruction tool, which offers an efficient workflow. FIB 200 also offers a unique STEM (scanning transmission electron microscopy) imaging option. The STEM option allows researchers to obtain high resolution images of nano-scale structures. It also offers a range of data acquisition options, such as high-speed imaging, for a more interactive imaging experience. PHILIPS FIB 200 has a range of other features that make it an ideal choice for many types of research. It is designed to be user-friendly and offers intuitive navigation, operation, and digital imaging. It also offers advanced analytic capabilities, such as feature recognition and measurement tools, which allow users to quickly interpret their data. Finally, FIB-200 has a range of software that enables powerful data analysis. Its powerful InSpect software allows users to analyze and quantify their data, as well as identify important structural features of their specimen. In addition, its EZSpect+ software offers simple workflows that enable users to save time while performing advanced analyses. Overall, PHILIPS / FEI FIB 200 is a powerful scanning electron microscope that offers advanced imaging and analysis capabilities. It is ideal for a range of nanoscale research applications, and is designed to be user-friendly and easy to operate. It offers great image resolution, contrast, and accuracy, as well as enhanced analytic tools and powerful software.