Used PHILIPS / FEI FIB 200 #293594795 for sale

PHILIPS / FEI FIB 200
ID: 293594795
Focused Ion Beam (FIB) system Ion column GIS Included.
PHILIPS / FEI FIB 200 is a state-of-the-art scanning electron microscope (SEM) designed for modern research environments. It is engineered with a high quality imaging capability, allowing it to observe structures in even the most delicate of samples. An integrated field-emission gun (FEG) contributes to its high resolution which allows for detective studies of materials at the atomic scale. The instrument is equipped with a high-precision sample chamber, giving a stable and robust mounting for samples ranging from delicate woven fabrics to fragile biological material. Meanwhile, its large 250mm target sample size accommodates a wide array of different sample sizes. This microscope features the advanced high-resolution imaging performance of a field-emission gun, making it ideal for studies such as defect analysis, nanostructure imaging, and nanotechnology. This enhanced imaging resolution is supported by real-time ballistic electrons in order to secure a sharp image even when imaging a delicate sample. Furthermore, the interactive digital manual scan mode allows users to adjust the scanning parameters according to their needs. FEI FIB 200 is integrated with a powerful energy dispersive spectroscopy (EDS) system which provides the analysis of the elemental composition of a sample. It is compatible with ultra-resolution lenses, allowing users to further push the resolution limit even in highly sensitive samples. This SEM is user-friendly and ergonomic. Features such as an image control station and large and intuitive control pads make sample imaging and operation more convenient for the user. PHILIPS FIB-200 is highly versatile, enabling users to perform a variety of tasks with just a single instrument. Its superior imaging resolution and intuitive interface make it the ideal tool for a wide variety of studies.
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