Used PHILIPS / FEI FIB 200 #293648640 for sale

PHILIPS / FEI FIB 200 Scanning Electron Microscope (SEM) is a powerful imaging and analytical tool. This microscope utilizes a field emission gun (FEG) to attain optimum transfer of electrons to the specimen. FEI FIB 200 enables higher resolution imaging, superior depth of field and more efficient operation than the traditional TEM/SEM microscopes. The instrument features an extendable magnify range from five thousand to one hundred thousand times and low noise, with excellent energy resolution up to 0.2 eV. This is in part due to the large Cs field lens with a length of 200 mm, which ensures optimum image transmission and detection. The low vacuum condition (<0.04 Pa) allows users to image delicate specimens and minimizes sample damage. The SEM also has a focus-stabilized sensing (FSS) system which allows for longer duration of observation. PHILIPS FIB-200 is equipped with a high-precision stage to ensure optimal sample positioning. This stage is able to move over distances of up to 100 mm in all directions and rotate up to ±40°. Additionally, the stage is capable of carrying out stacked multi-point scans in a single session, and possess a V-shaped grid and a wide range of standard scanning accessories. This analytical instrument has an array of analytical applications, some of which include energy dispersive X-ray spectroscopy (EDX), secondary electron imaging (SEI) and transmission electron imaging (TEM). It also has the ability to collect numerous high resolution images, in a pulse count mode, allowing for more accurate data collection. Users of FIB-200 can benefit from its in-built automated hardware and software, which significantly reduce setup times, as well as explore the extra capabilities the instrument has to offer such as its conventional electron beam lithography capabilities. PHILIPS / FEI FIB-200 SEM is a powerful analytical and imaging tool, offering an array of reliable features and capabilities. It is highly effective in making analytical measurements of both organic and inorganic specimens. Its high performance, as well as its numerous automated applications, make this instrument an optimal choice for users seeking a reliable and efficient SEM.