Used PHILIPS / FEI FIB 200 #293595359 for sale

PHILIPS / FEI FIB 200 is a scanning electron microscope that combines field emission electron optics, focused ion beam (FIB) technology, and advanced analysis. This powerful tool is designed to provide operators with comprehensive imaging and analysis capabilities. The main component of FEI FIB 200 is the revolutionary dual-detector system. This consists of an Annular Dark Field (ADF) detector, which provides rapid topographical analysis, and a Backscattered Electron (BSE) detector, which can identify different chemical components. The ADF detector of PHILIPS FIB-200 allows for extremely high-resolution imaging. This powerful imaging capability yields a maximum resolution of 3 nanometers, offering highly detailed images. In addition to its impressive imaging capabilities, FEI FIB-200 also comes equipped with a Precise Ion Beam Generator. This provides increased accuracy in fabrication, allowing the integrated system to produce high-quality cross-section images, and high-resolution three-dimensional surface reconstructions with unparalleled accuracy. FIB-200 also includes an integrated FIB-SEM port, which allows for seamless connection to FIB systems for high-resolution imaging, atom probe tomography and other advanced analysis. This feature significantly increases the versatility of the system, as a variety of sample structures can be directly manipulated. One of the most impressive features of PHILIPS / FEI FIB-200 is its advanced software. This software suite provides a variety of powerful tools, including automated image sequence generation, automated examination of replicated samples and interactive 3D data analysis. FIB 200 provides the perfect solution for imaging and analysis of even the most complicated samples. Combining field emission electron optics, focused ion beam technology and advanced data analysis, this scanning electron microscope is an essential tool for any laboratory.