Used PHILIPS / FEI FIB 200 #9298847 for sale

PHILIPS / FEI FIB 200 is an advanced scanning electron microscope (SEM) which is used for the observation and study of microscopic and nanoscopic samples. This particular electron microscope is used for high-resolution imaging and material analysis in the fields of materials science, industrial metallography and life sciences. FEI FIB 200 is equipped with an environmental view, which enables it to observe samples in non-vacuum conditions and a large variety of liquid and gaseous conditions. This means that the microscope can be used to analyze samples without having to maintain a vacuum around the sample. The scanning electron microscope has a high-resolution electron detector, which is capable of detecting electrons with an energy resolution of 0.01 eV. This is important since it can measure electrons with a high enough resolution to detect the smallest features of an image. PHILIPS FIB-200 is also equipped with a secondary electron detector. This is important because it allows the microscope to detect secondary electrons that are produced when an electron beam strikes the surface of the sample. This is useful for studying the surface properties of the sample and generating high-resolution images. PHILIPS FIB 200 also features an ultra-high vacuum system, which allows for a controlled environment in which samples can be studied. This is important since it minimizes contamination of the sample and avoids the damage caused to samples by other gases in the air. The electron microscope has two complimentary illumination systems. The first is the field assist illumination system, which uses reflected electrons that are scattered off the sample to generate bright images of the sample. The second is the secondary electron mode, which generates bright images of the surface of the sample by detecting the secondary electrons that are generated when the electron beam hits the sample. Lastly, PHILIPS / FEI FIB-200 has a high-resolution digital camera, which allows for the generation of digital images of the sample. Furthermore, the microscope is equipped with software that allows for 3D reconstruction of the sample. This is useful for creating three-dimensional models that can be used for analysis and visualization of the sample.