Used SEIKO SMI 3200 #9025735 for sale

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ID: 9025735
High performance FIB SEM system Specifications: Secondary electron image resolution: 4 nm Maximum probe current density: 30 A/cm2 or more Maximum probe current: 20 nA Observation field: 0.5 x 0.5 um to 2 mm Beam irradiation position stability: 0.1 um/10 min Acceleration voltage: 5 to 30 kV Ion source: Ga liquid metal needle ion source Guaranteed running time: 1000 h Maximum acceleration voltage: 30 kV Ion source control: Filament current, suppression electrode, extraction electrode Lens: Electrostatic type Blanking: Electrostatic type Optical axis correction: Electrostatic type Stigmator correction: Electrostatic type Adjustable aperture: 2-Axis motor drive XY Deflector: Electrostatic type Scan rotation: 0~359.9º / 0.1º Step setting Currently in storage 2006 vintage.
SEIKO SMI 3200 is a powerful and reliable scanning electron microscope (SEM) ideal for a wide variety of applications. It features a turbo pump producing an ultimate vacuum down to 5x10-4 Pa, and its unique variable beam technology offers superior imaging resolution with a working distance of up to 8mm. SMI 3200 includes a built-in scanning electron microscope detector that can be tuned for specific types of sample analysis, and it offers the highest sensitivity and resolution available. It's also equipped with an advanced computer controller, ensuring that data and images are displayed quickly and easily with minimal operator intervention. Additionally, SEIKO SMI 3200 facilitates digital imaging, with the ability to acquire live, real-time images of various sizes, and to analyze images from as small as 10nm to several hundred microns. SMI 3200 is equipped with an ultra-high resolution camera and a variable field of view which allows the operator to focus on any area of the surface at any magnification level, without the need for focus adjustments. Additionally, the detector can be used with features such as Bright Field Imaging which is ideal for crystal elements; Contrast Enhancement which can picture nano-scale fine structures on sample surfaces; and Dual-beam Imaging which can combine both secondary electrons and backscattered electrons for 3D images. SEIKO SMI 3200 is extremely user-friendly, with a highly intuitive graphical user interface, allowing for quick and easy set-up and operation. Additionally, the scanning electron microscope facilitates on-screen data display which enables immediate feedback of image analysis results. In conclusion, SMI 3200 is a reliable and powerful scanning electron microscope ideal for a wide variety of imaging applications. Its superior performance, user-friendly design and reliable operation make it the perfect tool for analyzing and imaging samples from very small to very large scale.
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