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Marketplace
Scanning Electron Microscopes
SEIKO
SMI 3200
Used SEIKO SMI 3200 for sale
Scanning Electron Microscopes
Manufacturer
SEIKO
Model
SMI 3200
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Popular Product
SEIKO
SMI 3200
FIB System Advertised resolution: 4nm Currently achieved resolution: <5nm Load time: 2’33” Sample si
179
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Popular Product
SEIKO
SMI 3200
Focused Ion Beam Scanning Electron Microscope (FIB SEM).
123
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