Used SEIKO SMI 3200 #9116789 for sale

ID: 9116789
FIB System Advertised resolution: 4nm Currently achieved resolution: <5nm Load time: 2’33” Sample size/stage movement: 8” Stage tilt: -5o to 60o Imaging options: secondary electron, secondary ion Etching capabilities: Ga ion beam, rate dependent on area.
SEIKO SMI 3200 is a scanning electron microscope (SEM) designed for high-resolution, digital imaging on a wide range of samples. It is capable of magnifying the sample up to 500,000X, and is equipped with a high-performance electron optical lens which provides optimal resolution and contrast. It features a field emission source, giving it a high and consistent brightness level. Additionally, its active backscattered electron (BSE) detector enables detailed imaging with corresponding elemental maps. Its rapid sample stage includes a hybrid designed for both scanning and tilting movement. This allows for automated, precise scanning of areas up to 4,000 mm2 and direct imaging of the sample surface. The low-vacuum (LVA-SEM) operation provides an ideal environment for imaging non-conductive samples. It is also equipped with a variable pressure equipment that features short pumping time and high resolution imaging. SMI 3200 is equipped with an x-ray (EDS/WD) detector with a high-accuracy 3D alignment and refining system that provides high-resolution observation and quantitative analysis of sampled areas. Moreover, the microscope is also compatible with SEIKO RedFilm for crystal orientation analysis. In addition, its integrated operation unit is easy to use with intuitive graphic interfaces. The microscope is also able to capture high-resolution SEM images and provides conversion of data into commonly used formats for further analysis. Furthermore, its high-speed data transfer machine facilitates analysis by rapidly transmitting images and quantitative data from the instrument to a host computer. Overall, SEIKO SMI 3200 is an ideal choice for those looking for a high-performance SEM. It features a high-resolution electron optical lens and BSE detector, providing unparalleled accuracy in imaging and elemental mapping. In addition, its low-vacuum operation, hybrid sample stage, EDS detector, and intuitive operation tool all make this SEM an excellent choice for digital imaging and analysis.
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