Used ADE / KLA / TENCOR 3910 #9301295 for sale

ADE / KLA / TENCOR 3910 Wafer Testing and Metrology equipment is an advanced automated system used to evaluate changes in semiconductor devices and materials such as wafers. The unit is equipped with both macro and micro inspection systems to provide accurate data on the state of the wafer. The macro inspection machine inspects an entire wafer surface and is able to detect large scale lithography related yield issues. The micro inspection tool uses high resolution imaging and spectroscopy to detect individual defects at resolutions of 0. 5 μm or higher. The asset is equipped with transport and staging hardware for indexing and transporting wafers into stations and through the inspection and metrology process. This model is designed to provide real-time input/output control of process and work procedures. In addition, ADE 3910 features an advanced equipment controller that integrates data transfer, wafer handling, inspection, and measurement software for semiconductor wafer testing. KLA 3910 is capable of rapid defect recognition at resolutions up to 0.3μm. The system uses automated defect recognition techniques instead of labor-intensive manual microscopic inspection. This helps to provide data quickly and accurately. The unit can also measure optical characteristics such as resistivity, topography, dark current, sheet resistance, and capacitance. The machine also has advanced feature metrology capabilities including roughness, surface topography, profile, flatness, height, and more. This allows for analysis of feature linearity, critical dimensions, overlay, and more. 3910 also allows for the measuring of 3D shapes including bumps and pads with micro-level accuracy. Overall, TENCOR 3910 Wafer Testing and Metrology tool is an advanced automated wafer testing and metrology asset designed to provide accurate data quickly and efficiently for modern semiconductor devices and materials. With a wide range of high resolution imaging and metrology capabilities, ADE / KLA / TENCOR 3910 is an ideal choice for semiconductor wafer testing and metrology applications.