Used ADE / KLA / TENCOR 6034 #104497 for sale

ADE / KLA / TENCOR 6034 is a high precision, advanced wafer testing and metrology equipment that offers comprehensive job company test and defect analysis. The system uses a proprietary optical imaging technology to inspect wafers, detect failure locations and quantify returned defects. Adequate Optical Defect Analyzer (AODA) imaging provides sophisticated defect recognition capabilities, enabling the unit to compensate for wafer warpage, displacement and various individual wafer features to accurately analyze defect detection. The measurement head of the machine contains two cameras: a 6.5 micron pixel imaging camera for detecting probe-induced defect, and a 0.8 micron pixel level camera for quantifying mechanical defects. The tool can measure on both front- side and backside of the wafer for full metrology coverage. It can detect micro-cracks as small as 0.1 micron and easily distinguish various types of individual defects from background noise. The asset can be programmed to identify specific defect parameter values, enabling it to recognize and quantify defect size, number and type. ADE 6034 is capable of simultaneously running a variety of testing procedures, including automated operational tests, mapping the layout of the wafer and inspection of die locations and peripheral interface testing. Post-processing and analysis of data collected by the model is completed by Semiconductor Analysis and Review Software (SAAR). The equipment's high-speed capabilities provide quick and consistent job scheduling, improved inspection cycle time, and reduced inspection and analysis time. The automated defect orientation of the system eliminates sample orientation errors that can often occur with manual systems and ensure the unit is always optimized for repeatable and reliable detection. The machine is available with both standard and custom modules to meet various requirements. The most advanced customization of the tool features a variety of capabilities, such as flexible inspection and analysis software that is capable of designing customized jobs and complimentary search algorithms that are optimized for specific wafer designs. All in all, KLA 6034 is an advanced Wafer Testing and Metrology asset that is capable of quickly and accurately analyzing various types of defect and identifying mechanical defects on both sides of the wafer. The model contains numerous customizable features that can be configured to meet the specific needs and requirements of the user. Combined, the equipment's high-speed and advanced capabilities provide improved testing cycle time and reduced inspection and analysis times to save time and cost.