Used ADE / KLA / TENCOR 7000 #163215 for sale

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ID: 163215
System Indexers Box containing numerous circuit boards Manual included Missing: Computer Power supply Pre-aligner.
ADE / KLA / TENCOR 7000 is a wafer testing and metrology equipment that provides fast, accurate, and low defect density stats for semiconductor components. This system is capable of inspecting and measuring the electrical, optical, and mechanical properties of every die on a wafer. Not only does it provide analysis for conventional uses such as shorts and opens, it also does 3D measurements of feature profiles, includingStep height, Overlap, Roughness, and Critical dimensions. Its repeatability and accuracy are crucial for process control and yield maximization. ADE 7000 makes use of advanced optical metrology tools to provide precise data on varying formats of products. This unit features an innovative, dual-axis advanced optical metrology tool that provides three-dimensional metrology data, combined with auto-guided scanning of the wafer. This allows for rapid measurement of various characteristics of wafers, as well as advanced anomaly detection capabilities. The machine also features a wide variety of production-level software and hardware options. This includes a Windows-based software suite, open architecture, automated wafer management and wafer defect analysis, and integrated vision, statistics and analysis tools. All of these features enable users to quickly identify and analyze standard and complex defects on their wafers, providing accurate measurement data and defect management without the need for manual entry. To ensure accuracy, KLA 7000 features automatic semiconductor die and die-to-die alignment, as well as worldwide calibration standards. This ensures that all measurements are precise and repeatable, allowing users to make reliable parts. This tool also has a built-in alarm asset for rejecting or repairing bad parts, as well as automatic part tracking. Overall, 7000 is a powerful, precise, and reliable wafer testing and metrology model. It allows for quick and accurate identification of defects and can help ensure the quality and reliability of your parts, as well as increase productivity. With its robust software and hardware options, it is an ideal choice for production-level wafer testing and metrology.
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