Used ADE / KLA / TENCOR 7000 #185169 for sale

ADE / KLA / TENCOR 7000 is a wafer testing and metrology equipment that offers high speed and accuracy for inspecting device structures used in the semiconductor and MEMS industries. The system utilizes a high-resolution optical microscope combined with advanced imaging and analysis technology to accurately measure device features at the nanometer level. It offers a wide range of parameters for automated testing and can accurately detect defects down to the 200nm level. ADE 7000 utilizes a multi-axis, high-speed stage for improved image acquisition and analysis. It features high-resolution optics and four image processing channels which allow for automated testing and measuring of layers, areas, lines, and other device structures. The unit also incorporates high-precision height measurement and data acquisition tools, as well as an advanced CCD camera that yields high-quality images. In addition, the machine supports a variety of software integration capabilities, including software for analyzing SEM images. This allows users to quickly perform a wide range of defect and die analysis operations, as well as design and measurement operations. Furthermore, KLA 7000 features an ergonomic design and intuitive front-panel controls that allow operators to easily switch between different applications or modify setup parameters. TENCOR 7000 is a specialized testing and metrology tool designed to provide superior testing and measuring results in a wide range of semiconductor and MEMS applications. It is reliable, accurate, and offers excellent versatility, making it an ideal platform for production environments that require high-quality testing and measurements.