Used ADE / KLA / TENCOR 7000 #9018651 for sale

ADE / KLA / TENCOR 7000 is a wafer testing and metrology equipment designed for comprehensive performance evaluation of wafer materials. The unit is composed of several components, including a Testing Head Module which houses the necessary tools and measurement capabilities. This module can measure a variety of parameters, such as wafer topography, defect size, surface contamination levels, doping levels, and sheet resistance. With this module, the system can cover a range of different types of tests in addition to standard parametric tests. The unit also includes an Onboard Spectrum Analysis (OSA) subsystem to enable high-speed wafer characterization. This subsystem utilizes Raman spectroscopy to measure the optical properties, giving users insight into the composition and purity of the material being tested. The integrated optical engine captures Raman spectra over the full visible spectrum. The machine is outfitted with a High-resolution video camera to inspect the interior of wafers during testing. This camera captures clear images used to identify possible defects in the material. Users can also customize the tool to measure through a variety of photolithography layers, enabling the determination of development process parameters. This asset is designed to produce accurate results through its combination of various testing technologies. As such, the model can produce wafer physical, electrical, and optical test results that are traceable to International Standard Units (ISUs) for reliability and traceability. Additionally, the unit can also produce third-party certified reports upon the completion of testing. ADE 7000 is powered by a Windows-based operating equipment, making it user-friendly and easy to operate. Users have the ability to monitor the system's tests parameters in real time and monitor wafer tests as they progress. The unit also generates reports summarizing the results of tests and comparisons of sample materials. Furthermore, the machine can be integrated with other software solutions to allow for quick and efficient data transfer. Overall, KLA 7000 is a comprehensive solution for wafer testing and metrology. With its diverse capabilities, the tool can measure various parameters with precision and accuracy. The user-friendly interface also makes being able to use the asset and transfer data a breeze. Together, these features ensure that the model can meet the needs of any production line.