Used ADE / KLA / TENCOR 7000 #98411 for sale

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ID: 98411
Wafer Size: 4" - 6"
Wafercheck inspection / resistance bow warp check system, 4" to 6" (4) Senders (12) Receivers Heads: low and high resolution Thickness station High res station Pre-aligner Manual Does not include computer (compatible with HP computer) Some spare elevators are available.
ADE / KLA / TENCOR 7000 is a high-precision wafer testing and metrology equipment designed to measure and monitor the performance of manufacturing processes such as etch, deposition, resistivity, and alignment. The system is capable of inspecting and measuring up to 200 mm diameter wafers using various advanced tools and techniques. ADE 7000 consists of four main components: a high-speed scan head, three-dimensional chucks, vision unit, and process control software. The scan head is equipped with an AlignMark™ vision machine, which is capable of measuring up to thousands of locations per second on a wafer. The three-dimensional chucks enable full three-dimensional measurement capabilities and enable the operator to adjust the position of specific components of the wafer for more accurate measurements. The vision tool consists of a powerful optical microscope that is capable of measuring critical device parameters such as x-y dimension and line width. KLA 7000 also features an RS232 interface and can be connected to most other standard computers. This allows the asset to interface with other equipment such as an impedance analyzer to measure the resistivity of wafers. Furthermore, a number of advanced data analysis and reporting features are built-in to the model providing the operator with detailed graphical results. The equipment also provides a complete list of process parameters that can easily be adjusted and monitored during the manufacturing process. This allows the operator to maximize the accuracy of their measurements and ensure consistent high-quality results. Furthermore, the system is highly customizable and can be used in a variety of applications. Overall, 7000 is an advanced wafer testing and metrology unit designed to provide accurate and reliable measuring results. It offers a powerful optical microscope, three-dimensional chucks, high-speed scan head, and process control software to ensure accurate results in a variety of manufacturing processes. In addition, the machine is highly customizable and provides a variety of advanced data analysis and reporting features.
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