Used ADE / KLA / TENCOR 9350 #9128720 for sale

ADE / KLA / TENCOR 9350 is a wafer testing and metrology equipment that is suitable for many different processes, including photo lithography, chemical-mechanical polishing (CMP) and deposition. The system is comprised of two components, an integrated metrology and wafer inspection subsystem, and a control subsystem. The integrated subsystems allow for efficient testing and metrology processes, making the unit an ideal choice for many industrial purposes. The integrated metrology and wafer inspection subsystem consists of an array of high-resolution imaging optics, additional lighting tools, and an automated metrology machine. The imaging optics allow for comprehensive analysis, including microscopic imaging, feature measurements, defect characterization, and contour mapping, among others. The lighting tools enable uniform illumination of the wafer, which helps to reduce image aberrations caused by extremes in light intensity. The automated metrology tool instantly captures and stores images of the wafer from multiple angles, allowing for detailed analysis and characterization. The control subsystem of ADE 9350 is comprised of a high-performance controller and a user-friendly graphical user interface (GUI). The controller is used to control the process parameters, while the GUI allows the user to set up automated testing and metrology processes and to view the acquired data in real time. The user-friendly GUI also allows the user to store images of different wafers, which can be accessed for comparison purposes. In addition, the controller is also capable of performing data processing, such as defect recognition, pattern recognition, and process control. Overall, KLA 9350 is an efficient and reliable wafer testing and metrology asset that is suitable for many industrial applications. The integrated metrology and wafer inspection subsystem provides comprehensive analysis and characterization of the wafers, while the control subsystem is easy to use and allows for automated testing and metrology processes. The combination of these two subsystems enables accurate and reliable testing and metrology of wafers, making the model an ideal choice for many processes.