Used ADE / KLA / TENCOR 9500 UltraGage #9248218 for sale

ADE / KLA / TENCOR 9500 UltraGage is a state-of-the-art wafer testing and metrology equipment that combines the technologies of automated defect inspection, thin film and surface metrology, and defect review into a single platform. ADE 9500 UltraGage offers exceptional mapping and analysis capabilities for wafer-level process control, enabling customers to measure, classify, and track yield-affecting defects to their source. KLA 9500 UltraGage offers a highly sensitive automated defect Inspection system with the capability of defect detection down to 5 nm. An integrated digital image analysis unit automatically identifies and collects data for classification purposes, enabling semi automatic defect review. The machine also offers automated series measurement capability for thin films, wires, lenes, and other surfaces. Equipped with several measurement technologies such as Faraday cup technology, laser scanning confocal technology, spinning resonance technology, optical scatterometry, and X-ray technology, 9500 UltraGage is capable of measuring wide varieties of film thickness, depth, profile, average area, line width, edge roughness, surface flatness, pour pattern, and other characteristics on wafers and substrates. The tool is engineered for optimum performance, with a faster signal/image processing capability, higher throughput, higher stability, and wider detection range. TENCOR 9500 UltraGage is also equipped with advanced optical inspection capabilities, which include automated scan/focus/illuminate functions, automated coated film thickness measurement, Snell's law comparison, and spectral narrow band imaging. The asset also supports bright field monitoring, dark field imaging, phase shift imaging, multi-win imaging, and other image analysis features for more accurate and precise analysis. The modular design of ADE / KLA / TENCOR 9500 UltraGage allows customers to optimize their testing model's capabilities for specific applications, with option modules for 3D imaging, large-scale defect review, and high-density pattern recognition. It also synchronizes with rigorous OEM software to integrate measurement and analysis processes with customers' existing systems. Finally, the software-controlled solution offers comprehensive data management and reporting capabilities. Overall, ADE 9500 UltraGage is a comprehensive wafer testing and metrology equipment that offers the highest levels of accuracy, flexibility, and speed. It will help in accurately pinpointing yield-affecting defects, optimizing processes, and ultimately improving product yields.