Used ADE / KLA / TENCOR 9500 #9152997 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ADE / KLA / TENCOR 9500
Sold
ID: 9152997
Ultra gauge multi-measurement system Includes: Single cassette ASC 1000 Controller E-Station Measures 8,700 data points in 60 seconds 2-D Contour map measurements Thickness: Center point Five points or full wafer scan Shape: Bow and warp using 3-point Global flatness: SEMI GBI, TIR, FPD, FPD% 5-Points TTV Site flatness: SEMI M1 standards Site size: 8-30 mm Variable offsets Thickness-accuracy: ±0/05 µm Repeatability: 0.15 µm Absolute range: Normal ± 125 µm Global flatness: Accuracy ± 0.15 µm Repeatability: 0.05 µm Site flatness accuracy: ± 0.15µm Wafer thickness: 400 µm - 1000 µm.
ADE / KLA / TENCOR 9500 is a wafer testing and metrology equipment designed specifically for semiconductor manufacturing applications. It records the electrical characteristics of semiconductor devices and components to facilitate processing and evaluation. The system is equipped with automated defect inspection capability and can detect particles that may impair the performance of the device. ADE 9500 utilizes a wide variety of test instruments including two dielectric microscopes, three optical microscopes, two SEMs, and several variable-angle spectroscopic ellipsometers. These instruments, along with the unit's superior imaging capabilities, allow for rapid and accurate inspection and measurements of defects, feature sizes, uniformity, quality parameters, and more. It can also be used to measure thicknesses, film properties, and yield rates. The test machine also employs adaptive pattern recognition (APR) technology to detect and analyze features that can be used to identify disease indications. This pattern recognition technology is also used to detect and characterize interconnects, dust and dirt contamination, material nonuniformity, and contamination in thin films, resistive layers, and other layers. KLA 9500 also includes a variety of automated wafer stockers and placement tools to increase throughput and accuracy. These tools simplify wafer loading, unloading, placement, and alignment and are able to pick and place wafers of any size and type. This makes it easier and faster to set up processes for analyzing wafers and performing tests. The tool can also be programmed to run diagnostic tests, typically measuring resistance values. These tests are especially useful when designing chips where the failing tests can help to pinpoint the root cause of a device's failure. TENCOR 9500 asset is capable of providing detailed, comprehensive, and accurate information about a variety of components and devices. This data can be used to boost production quality and efficiencies, as well as to reduce costs. It is also versatile enough to fit a wide variety of semiconductor manufacturing applications. 9500 model is designed to provide reliable, consistent, and accurate wafer inspection and metrology.
There are no reviews yet