Used ADE / KLA / TENCOR 9500 #9193767 for sale

ID: 9193767
Spare parts for probe and its controller.
ADE / KLA / TENCOR 9500 wafer testing and metrology system offers advanced testing capabilities for a wide range of semiconductor technologies. ADE 9500 features a light-weight, flat-panel design and powerful motors, enabling unparalleled wafer alignment accuracy and high-speed scanning. The system is equipped with a high-sensitivity, high-resolution lasers for quick and accurate defect detection. KLA 9500's advanced image-scanning optics automatically detects and recognizes sub-micron defects over a range of 5x or more, while a 100Mpixel CCD camera captures both wide-field images and higher-magnification pixels. In addition, a top-down, laser-based focus inspection technology offers support for image capture and measurement. The system can conduct comprehensive YieldStar-APC and critical dimension wafer testing as part of its comprehensive test suite. YieldStar-APC evaluates chip-level critical features for both complete process coverage and robust process fault correlation. Its critical dimension test suite offers comprehensive measurements, including edge-only, oblique, area, and round measurements. To ensure consistent performance in a variety of environments, TENCOR 9500 can be adjusted to accommodate different gas compositions, pressure, and humidity levels for testing purposes. 9500's modular architecture enables easy expansion, allowing for upgrades, modifications, and custom configurations as needed. It is also designed to be easy to use, with intuitive controls and menu navigation for faster and more efficient operations. ADE / KLA / TENCOR 9500 is a cost-effective solution for a variety of applications, including wafer probe testing, metrology applications, and process monitoring. Its advanced features ensure reliable, high-quality results, making it an ideal solution for manufacturers looking for precise, cost-effective testing solutions.
There are no reviews yet