Used ADE / KLA / TENCOR 9500 #9250505 for sale

ADE / KLA / TENCOR 9500 is a wafer testing and metrology equipment designed for the semiconductor industry. It is an advanced tool that provides comprehensive wafer inspection capabilities, with multi-modal metrology for a wide variety of wafer processes. It combines advanced inspection with high resolution imaging and motion control to provide maximum flexibility for a wide range of metrology applications. ADE 9500 system utilizes a highly advanced wafer handling unit which allows for precise motion control for precision wafer measurements and testing. This machine utilizes three-dimensional scanning technology to provide detailed images of the wafer surface. The tool also features integrated digital microscopy which enables greater focus control and accuracy for the wafer tests. KLA 9500 asset includes a range of capabilities for wafer metrology including characterization of various process parameters such as composition, morphology and grain structure, as well as measurement of various parcs such as physical dimensions, dopant concentration, etc. The model also includes modules for wafer defect identification and characterization, providing automatic detection and placement of custom masks for defect analysis. The equipment also contains functions for overlay measurements, providing features for precise registration of semiconductor components. TENCOR 9500 metrology system can be fully integrated with other wafer testing and metrology tools such as surface sheet resistivity testers, defect types and surface detectors, etc. This enables seamless integration for comprehensive wafer testing and metrology. The unit is highly configurable, allowing users to customize the machine for specific process and device requirements. 9500 is a robust and user-friendly tool that provides comprehensive capabilities for wafer testing and metrology. The advanced inspection capabilities and extensive integration options make it an ideal choice for semiconductor metrology applications. The tool is easy to use and it is designed to be highly reliable and accurate, providing excellent results in wafer testing and metrology.