Used ADE / KLA / TENCOR 9500 #9258759 for sale

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ID: 9258759
System With ASC 2000 controller.
ADE / KLA / TENCOR 9500 is a wafer testing and metrology equipment, perfect for complete metrology and testing solutions for semiconductor wafer production. The system is capable of testing, inspecting, and measuring wafers for critical sizes, shapes, and electrical properties. The unit features high-speed metrology and high-accuracy measurement capabilities through its dual-sided approach and advanced vision and die-to-die recognition. The machine offers multiple test algorithms, such as dynamic stress testing, failure analysis, real-time imaging, and advanced fault-finding. It also offers process control and optimization capabilities to help producers maximize the yield of their production. ADE 9500 tool is equipped with up to 50 metrology channels on both sides of the wafers, allowing for faster and more accurate measurements. This capability is amplified by the use of advanced pattern recognition algorithms, enabling faster test and measurement. The asset also features multiple languages of integration, including HTML, VBScript, and Lab VIEW, allowing it to be integrated into all current semiconductor fab environments. The model also includes sophisticated embedded traceability technology, ensuring production traceability and pattern accuracy. This traceability technology reduces the risk of device variability, making sure that products and production processes are consistent. It also allows for the tracking of production process variables and machine performance, allowing for better process control. Another feature of KLA 9500 is the high control resolution. This makes it possible to measure a wide range of subtle variations in the production process, optimizing processes to improve yields. TENCOR 9500 equipment provides unmatched wafer performance analysis. Using the data from the metrology channels, it can quickly identify process and product issues, allowing for faster corrective action on issues like particle contamination or die shape variation. Overall, 9500 provides an efficient, fast, and accurate way to measure and test wafers. It has the ability to test, inspect, and measure wafers quickly and precisely, allowing producers to maximize yields and minimize variability. With its advanced features and high-performance capabilities, the system offers an all-encompassing solution for semiconductor wafer production.
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