Used ADE / KLA / TENCOR 9600 / 9700 #9008898 for sale

ADE / KLA / TENCOR 9600 / 9700 Wafer Testing and Metrology Equipment is a state of the art metrology system designed to assist semiconductor manufacturers with the analysis and mapping of wafers. It utilizes a combination of optical, chemical, electrical, and mechanical methods to provide comprehensive analysis of various process steps. The unit is based on a flexible, modular design, allowing for easy integration into existing test and analysis processes. ADE 9600 / 9700 is capable of measuring a wide variety of parameters, including metrology including resistivity, capacitance, thickness, surface topography and composition, while the 9700 features advanced defect detection and characterization capabilities. The 9600 and 9700 systems are built around a powerful data acquisition and analysis platform that can store up to 2TB of data. The machine can be customized to the specific needs of individual semiconductor manufacturers, allowing for both high throughput and precision. The tool can run both manual and automated processes, enabling it to be used for both development and production tests. It is capable of measuring a variety of sample sizes, from single chips to wafers up to 450mm in diameter, and is designed to provide reliable, accurate readings with no drift due to exposure or oxidation. KLA 9600 / 9700 asset is equipped with an extensive range of optical, mechanical, and electrical measurement devices, including an 8-level CCD imaging model for high resolution wafer measurements, a high resolution optical profilometer for surface topography measurements, and a resistivity sensor for 2D and 3D capacitance measurements. Other included features include a low dark current/ self-testability equipment for lighted detection of shorts and open circuits on wafers, and a defect review system for defect location and characterization. TENCOR 9600 / 9700 is an advanced metrology and wafer testing unit designed for high throughput and accuracy. The machine features a modular design, enabling customers to add and extend its functionality as required. This makes it an invaluable tool for semiconductor manufacturers, providing comprehensive wafer testing and metrology capabilities.