Used ADE / KLA / TENCOR 9600 #9234990 for sale

ADE / KLA / TENCOR 9600 is an advanced wafer testing and metrology equipment designed for quality control and process optimization in the semiconductor manufacturing process. It enables fast, accurate and precise characterization of wafer surfaces and patterns, allowing operators to minimize costly production yield losses. The system uses advanced non-contact optical metrology techniques, including multiple imaging, measuring and image analysis operations. It has an integrated color CCD (charge-coupled device) camera and laser diffraction sensor with an 8-inch wafer inspection range. It also includes an auto-focusing unit and an industry-leading algorithm for fast and accurate automatic pattern recognition. This metrology machine supports a variety of measurement techniques. It can measure critical dimensions such as line widths, line spacings, line end points and line angles, as well as more complex parameters like total line contour. It also supports spectroscopic ellipsometry to measure various thicknesses and refractive indices for characterization of thin films. ADE 9600 is integrated with the latest statistical process control (SPC) software that enables the evaluation and analysis of large production batches. The tool comes with a wide range of specialized software tools, such as edge detection, grayscale mapping, and critical dimension analysis. This enables the operator to quickly process large amounts of data from many wafers and easily identify non-conforming units. KLA 9600 boasts a comprehensive programmable applicationbuilding environment that can be used to create custom semiconductor test solutions. This includes powerful pattern recognition algorithms, libraries of ready-to-use measurement scripts and complete support for external programming languages such as C, C++ and Visual Basic. Finally, the asset features a high-resolution 5.7" touchscreen display combined with a highly intuitive graphical user interface (GUI). This makes it easy to carry out metrology operations, reducing user errors and time needed to carry out measurements. 9600 is a powerful wafer testing and metrology model designed to help manufacturers improve the quality and efficiency of their semiconductor production process. With its advanced non-contact optical metrology techniques, industry-leading recognition algorithms and versatile software tools, it allows users to quickly identify and analyze defects on wafer surfaces.