Used ADE / KLA / TENCOR 9600 #9240649 for sale

ADE / KLA / TENCOR 9600 is a wafer testing and metrology equipment developed by ADE. Since its introduction in 2006, ADE 9600 has become widely adopted by semiconductor and flat-panel display industries for its ability to fast and accurately test small features on thin wafers. KLA 9600 system features a Horizontal Build Optics (HBO) unit that enables precise measurements of wafer feature size, shape, and consistency at high speed. This machine is capable of precisely measuring feature sizes in the range of 30nm up to 10 um with excellent accuracy. TENCOR 9600 is also equipped with high-resolution imaging systems up to 5um, allowing for high-fidelity imaging of small features and defects on the wafer surface. 9600 tool is also capable of performance metrics analysis for quicker process control and cycle times. The asset utilizes metrics such as overlay, critical dimension (CD), image quality, and wafer rotation to quickly diagnose and improve process conditions. Additionally, the model can analyze the composition of overlay, resist defects, and contamination of the wafer surface. ADE / KLA / TENCOR 9600 equipment is designed with high reliability in mind, with a backend system designed to perform continuous testing in static or dynamic environments. The unit is also designed with a full suite of automated capabilities, including a calibration function, automated result-processing, rapid image analysis, and automatic pressure application. Furthermore, ADE 9600 machine is designed to interface with a central, unified software platform allowing users to track wafer testing from one wafer to the next, instantly detect any wafer defects, and facilitate corrections. This tool is also able to provide users with fast feedback on yield and quality data. In conclusion, KLA 9600 is an advanced wafer testing and metrology asset that is widely adopted by semiconductor and flat-panel-display industries. It features a Horizontal Build Optics (HBO) model and high-resolution imaging systems for accurate wafer feature testing, as well as a range of automated functions and a unified software platform.