Used ADE / KLA / TENCOR AFS 3220 #293641958 for sale

ADE / KLA / TENCOR AFS 3220
ID: 293641958
Wafer inspection system.
ADE / KLA / TENCOR AFS 3220 is a wafer testing and metrology equipment that offers a high level of accuracy and repeatability for a variety of wafer test and metrology requirements. It consists of an optical wafer metrology module, a wafer tester, a profilometer, and a data acquisition system. The data acquisition unit acquires and stores data from the test and metrology operations, providing the necessary data for process control. The optical module has a precision optical quartz backing plate, designed to give users superior stability and repeatability. It can take images of the wafer at various magnifications and levels of granularity, and relies on a multilayer microprocessor-controlled imaging machine. The tool is capable of spending various types of analysis including Fourier analysis and image processing on the acquired data, in order to give users the most accurate measure of the wafer's condition. The wafer tester module is designed to detect and analyze various die defects, such as shorts and opens, pattern defects and electrical faults. The tester uses high-resolution pattern recognition techniques, allowing for rapid and reliable defect detection. It also has the ability to run tests at a high throughput rate, making it ideal for high-volume production requirements. The profilometer module is designed to measure the profile of the wafer surface, as well as any other surface features. The profilometer is equipped with a laser and nanometer interferometer head which can accurately measure the profile of the wafer with sub-micron accuracy. Finally, the data acquisition asset allows for data to be collected and stored from all of the other modules. This data can then be used to measure the wafer quality, detect and analyze defects, and provide the necessary information for process control and yield management. ADE AFS 3220 model is an ideal solution for any organization needing a reliable, accurate and repeatable wafer testing and metrology equipment. It offers superior accuracy with a wide range of features, while still maintaining a robust, cost-effective and energy-saving system.
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