Used ADE / KLA / TENCOR AFS 3220 #293645321 for sale

ADE/ASF 3220 is a wafer testing and metrology equipment used to measure the physical and electrical attributes of semiconductor wafers, including dopant concentrations. The system contains a host of specialized instruments that are designed to perform a variety of wafer quality assurance related tasks. The wafer testing and metrology systems incorporate a web-enabled data acquisition unit that provides a user-friendly interface and a secure, scalable platform for collecting data from test and measurement activities. This machine supports multiple operating systems such as Windows and Linux and enables automated scheduling of multiple testing and metrology processes. The tool also includes powerful software for data manipulation and statistical analysis. This asset can analyze single or multiple wafers using high-speed scanning electron microscopy and advanced imaging techniques. Wafer size and shape form are also important properties and can be measured with the model's automated wafer shape and size measuring tool. It can also measure dopant concentrations in test wafers using optical luminescence spectroscopy. Other tests such as depth profiling to measure interface profiles and scanning capacitance microscopy for yield optimization can also be performed with the equipment. The system also integrates with a suite of software packages that enable easy analysis of data sets collected during the testing process. Advanced software libraries provide increased capability in dealing with complex analysis tasks. The unit also supports a variety of graphical user interfaces, allowing users to quickly evaluate wafer surface parameters and complex device architectures. Overall, ADE / KLA / TENCOR AFS 3220 wafer testing and metrology machine provides comprehensive and comprehensive testing capabilities. This advanced tool allows users to confidently measure physical and electrical parameters of semiconductor wafers to ensure the highest quality. The asset provides a user-friendly interface and advanced software analysis tools that can be applied to a variety of different counting and metrology tasks.