Used ADE / KLA / TENCOR AFS 3220 #293645327 for sale

ADE / KLA / TENCOR AFS 3220 is a state-of-the-art wafer testing and metrology equipment designed for high accuracy, high throughput measurement and testing of semiconductor components. It provides the ability to evaluate and monitor the quality of semiconductor wafers throughout the manufacturing process from start to finish. The system provides a comprehensive set of capabilities for wafer testing and metrology and has been designed for production environments. The unit has a high accuracy and high speed CCD imaging engine, which is capable of producing images of up to 160 megapixel resolution. This powerful imaging engine is combined with a high-precision laser and optical machine, which is enables it to accurately measure the critical features on a semiconductor wafer. The precision laser tool can measure features as small as 0.4 micrometers and correctly reference them to the wafer surface for accurate alignment and repeatability. The asset is able to detect a wide range of semiconductor defects with its defect analysis tools. It uses advanced pattern recognition techniques to accurately identify and classify defects in a wide range of parameters such as size, shape, and location. The model also has advanced Overlay and Critical Dimension (OCD) control, which allow it to measure die-to-die, wafer-to-wafer, and die-to-die-to-wafer offsets with high accuracy and repeatability. This ensures that all wafer measurements are consistent and reliable. ADE AFS 3220's comprehensive suite of reporting and analysis tools provide actionable insights into the manufacturing process. It is able to provide detailed statistical analysis of production, yield, and quality data, allowing process engineers to quickly identify and address process issues. The equipment also includes a suite of display tools which provide real-time visualization of production data, allowing users to quickly identify trends and process issues. In summary, KLA AFS 3220 is a powerful wafer testing and metrology system which is capable of delivering high accuracy results in a production environment. The unit is capable of detecting a range of defects and its comprehensive suite of reporting and analysis tools provide an accurate insight into the manufacturing process.