Used ADE / KLA / TENCOR AFS 3220 #293645328 for sale

ADE / KLA / TENCOR AFS 3220 is a high performance wafer testing and metrology equipment that is optimized for semiconductor device and material characterization. This system features a patented auto-load and unload capability that conveniently handles wafer up to 8 inch diameter. With a fully Automatic Focus Stabilization (AFS) technology, the unit automatically maintains a stable focus during wafer referencing and metrology operations, even when the wafer's position changes without manual adjustment. ADE AFS 3220 machine offers a number of powerful metrology capabilities to the user, starting with a both top and bottom surface scanning and imaging capabilities. The advanced optical technology incorporated into the tool provides greater precision and accuracy than traditional methods and improves measurement repeatability. With its high resolution scanning, users can detect micro-defects and imaging artifacts, which can greatly reduce wafer waste. For defect/particle detection, traditional CD metrology, and other automated metrology operations, advanced software algorithms ensure that highly accurate results are obtained quickly. In addition to its unmatched performance, KLA AFS 3220 wafer test and metrology asset also offers a wide range of other features and benefits, such as a specially designed automated defect review model that enables users to quickly identify and qualify defects with high accuracy. This equipment also features customizable test recipes to customize system parameters according to the type of product being sampled - which helps improve yield and throughput. Other features of TENCOR AFS 3220 include a ultra-low noise design for high accuracy measurements and a advanced vision unit for comprehensive wafer registration, sub-pixel alignment, and defect detection and qualification. In conclusion, AFS 3220 wafer testing and metrology machine provides an efficient and reliable solution for device and material characterization. Featuring top and bottom surface scanning, advanced focus stabilization technology, automated defect review tool, customizable test recipes, ultra-low noise design, and advanced vision asset, the model is designed to provide its users with consistently accurate results.