Used ADE / KLA / TENCOR AFS 3220 #293660057 for sale

ADE / KLA / TENCOR AFS 3220 is a high performance wafer testing and metrology equipment developed for use in industrial applications such as semiconductor manufacturing. It provides a comprehensive set of features for accurate process and wafer inspection, metrology, and analysis. ADE AFS 3220 is designed with a robust measurement and test interface that enables the use of a wide range of measurement and test tools such as wafer probers, optical metrology systems, and other subsystems with a high degree of compatibility. This allows for a variety of characterization tasks including electrical characterization, 3D imaging, critical dimension measurements, thin-film topography, and surface topology measurements. The system integrates an automated test unit to help expedite data collection and analysis. The machine also includes powerful data analysis features with support for advanced statistical techniques and real-time analysis of data. The tool can perform root cause analysis, determine correlations between process parameters, and identify outliers. The graphical user interface (GUI) provides an intuitive and easy to use environment for quick and efficient data analysis. KLA AFS 3220 also provides wafer classification and sorting capabilities. This allows for automated wafer preparation and testing processes as well as sorting of wafers into graded groups based on test results. This is an important feature for high-volume manufacturing of semiconductor devices. For process optimization, TENCOR AFS 3220 integrates a fully automated and repeatable control asset that includes a comprehensive set of process and device analysis tools. This model can help to pinpoint process problems quickly and accurately and maximize process yield. The equipment also includes advanced logbook capabilities to store and analyze process information for each wafer. Overall, AFS 3220 is an easy-to-use, powerful, and reliable system designed for high-volume industrial semiconductor manufacturing processes. Its comprehensive measurement and test capabilities, fast data analysis, and advanced process control features make it an invaluable tool for wafer testing and metrology.