Used ADE / KLA / TENCOR AFS 3220 #293757402 for sale

ADE / KLA / TENCOR AFS 3220 is a semi-automated wafer-testing and metrology equipment designed for measuring physical, electrical, and optoelectronic properties of semiconductor materials. This system provides visual inspection and automated defect classification, wafer mapping and resistance testing, as well as an integrated optical imaging station for wafer surface and backside inspection. ADE AFS 3220 includes an optical microscope with a programmable bridge and a 150mm dual-headed operability that enables high-precision inspection of both sides of the wafer. A high-resolution Polarized Light and Reflection (PLR) inspection option facilitates the analysis of oxide and CARI and other materials. The unit also includes a maximum of four measure-while-inspect (MWI) Laser Diodes, one of the most popular tools for rapid electrical testing of semiconductor devices. This high-precision, integrated machine provides accurate, repeatable readings of device parameters and enables high speed electrical locating of defects. A camera workstation is included in the tool to enable parameter metrology, image analysis, and real-time defect masking. The automated defect classification (ADC) allows users to quickly locate and classify defects based on characteristics, while the wafer mapping feature provides an instant overview of the wafer structure and data patterns. The wafer mapping can be applied to both portions and full-height wafers. KLA AFS 3220 is designed to meet the highest industry requirements for operations, reliability and asset integration. Its robust components and software are designed to ensure maximum data accuracy and model stability. It features an intuitive, user-friendly interface and requires minimal maintenance and training. Its multiple tool access and option capabilities enable it to be configured for a variety of customer-specific applications from single- to multi-user solutions, while its scalability makes it an investment that will continue to produce results over time. TENCOR AFS 3220 wafer testing and metrology equipment is designed as an integrated solution to fulfill all your needs for automated wafer inspection, defect classification, and electrical testing. The system enables maximum production yield, accuracy, and cost savings, and provides the complete, consistent information required for the development and production of advanced microelectronics.