Used ADE / KLA / TENCOR AFS 3220 #293771675 for sale
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ID: 293771675
Wafer Size: 12"
Vintage: 2004
Wafer inspection system, 12"
2004 vintage.
ADE AF S3220 is a high-performance wafer testing and metrology equipment for the semiconductor industry. This system utilizes cutting-edge imaging and metrology technology to inspect, measure, and analyze wafers and other semiconductor devices. ADE / KLA / TENCOR AFS 3220 is an automatic, high-speed unit that operates on a closed-loop feedback control machine. This process ensures precise surface measurements of wafers and thin-film layers at nanometer-level accuracy. The tool is capable of testing wafers with a range of sizes up to eight inches (203.2 mm) in diameter. In addition, ADE AFS 3220 has a configurable field of view ranging from 20 mm to 450 mm. KLA AFS 3220 incorporates advanced imaging and metrology techniques for precision wafer testing. This includes Phase Coded Defocusing (PCD), which accurately measures wafer features and produces high-contrast images. High-speed Shutter Scanning is used to rapidly acquire in-depth three-dimensional images. Scanning Electron Microscopy (SEM) provides a detailed view of the surface topography under an electron beam. Furthermore, subsurface metrology capabilities are enabled by Chemical Milling, where processed cross-sections are microscopically inspected for potential defects. AFS 3220 asset also features several advanced features to enable efficient testing and analysis. This includes an in-line defect review model, which allows review of potential defects quickly and efficiently. Automated defect classification and detection minimize the time spent by personnel on routine manual inspection. In addition, a die recognition equipment is capable of visual recognition of die patterns. In conclusion, TENCOR AFS 3220 wafer testing and metrology system is a reliable and efficient solution for semiconductor testing. This unit combines cutting-edge imaging and metrology technology with advanced features, including Phase Coded Defocusing, high-speed Shutter Scanning, and in-line defect review. Furthermore, ADE / KLA / TENCOR AFS 3220 has a configurable working range to accommodate various types of wafers and sizes. ADE AFS 3220 is an essential tool for semiconductor manufacturers, providing efficient and reliable wafer testing and metrology capabilities. This machine's combination of features and features makes it a reliable tool for high-precision testing and analysis of wafers and other semiconductor devices.
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