Used ADE / KLA / TENCOR Measuring probe for 9500 UltraGage #9233398 for sale

ADE / KLA / TENCOR Measuring probe for 9500 UltraGage is a digital, metrology equipment designed for wafer testing and inspection applications. It is designed to provide precise measurements of wafer topography, line widths, and critical dimensions in the nanometer range. The probe is highly accurate and can be utilized for both planar and 3D topography measurements of semiconductor wafers. ADE Measuring probe for 9500 UltraGage offers superior performance due to its innovative design. The probe is integrated with advanced sensors, including a capacitive sensor array that is designed to detect voltage changes in even the smallest of features. Other components, such as an encoder and a shutter, provide accurate and repeatable measurements. The probe also contains an on-board processor and a laser detection system that enable fast analysis of detailed features. KLA Measuring probe for 9500 UltraGage also includes a programmable metrology software package. This package enables users to easily set up new measurement processes and to optimize and customize settings for each application. The built-in edge detection features provide accurate measurements of line widths and other critical dimensions. The software is designed for use in highly-automated, high production environments, allowing for effective wafer testing and metrology. Measuring probe for 9500 UltraGage is a reliable and compact unit. Its modular design allows users to quickly and easily configure the machine for their specific needs. The probe is also compatible with ADE Digital Image Analysis systems, which further enhance the accuracy of measurements. TENCOR Measuring probe for 9500 UltraGage is designed to provide high precision measurements of wafer topography and line/space widths with nanometer accuracy. Its innovative design, coupled with a powerful software package, makes this probe ideal for wafer testing and metrology applications in high-throughput environments.