Used ADE / KLA / TENCOR MicRhoSense 6035 #9301391 for sale

ID: 9301391
Slice resistivity gage.
ADE / KLA / TENCOR MicRhoSense 6035 is a powerful wafer testing and metrology equipment designed to measure and inspect various micro- and nano-scale components on conventional or advanced substrates. This system is especially useful for inspecting processors, memory chips, and other components when evaluating their performance and durability. The unit is capable of measuring electrical properties, such as voltage, current, capacitance, and resistance. This machine is also capable of performing optical measurements such as microscopy, reflectance imaging, and ellipsometry. Additionally, the tool can analyze features such as line width, linewidth variation, critical dimension, pitch, overlay, CD-SEM, and FinFET patterning. In addition to traditional optical and electrical tests, the asset is also capable of 3D imaging, allowing it to accurately measure the profile of micro- and nano-scale features. The 3D imaging can be used for measurements such as topography, profile analysis, via depth measurements, surface characterization, and stress mapping. ADE MicRhoSense 6035 features a high-speed, 256-bit high-density imaging chip. This state-of-the-art image processing technology is capable of capturing and analyzing microscopic images quickly and accurately, allowing for rapid and efficient testing and metrology of micro- and nano-scale components. The model is equipped with a proprietary energy filter, allowing accurate measurement of atomic force microscope (AFM) images. The energy filter can be used to measure surface topography, grain structure, and roughness. The equipment also features a high-speed digital signal processor (DSP) for real-time digital signal processing of imaging data. The system is user-friendly and features a touchscreen interface, allowing users to easily and quickly navigate its various features. This unit is well-suited for a wide range of applications, from research and development to routine testing of micro- and nanoscale components. Overall, KLA MicRhoSense 6035 is a powerful wafer testing and metrology machine that can quickly and accurately measure and analyze micro- and nano-scale components. Its efficient, specialized imaging capabilities make this tool ideal for a variety of applications, from routine chip production to research and development.
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