Used ADE / KLA / TENCOR MicRhoSense 6035 #9301392 for sale

ADE / KLA / TENCOR MicRhoSense 6035 is a sophisticated wafer testing and metrology instrument designed for high-volume production and quality assurance in wafer manufacturing. It features a compact and modular design with a small footprint and minimal sample preparation requirements. The equipment is built around an advanced image processing subsystem that quickly identifies wafer defects such as scratches, particles, and surface imperfections. It also performs non-destructive 3D metrology measurements, with customizable sampling points and high accuracy level. ADE MicRhoSense 6035 is equipped with an integrated robotic system which allows for automatic navigation and sample handling. The unit is also configured for high capacity wafer loading, with side-to-side feeding operations and a vibration-reducing sample holder. This ensures that samples are transported and handled rapidly yet with utmost precision. KLA MicRhoSense 6035's defect detection capabilities are partly driven by its integrated Intelligent Imaging platform. This innovative software engine uses advanced algorithms to enable automated particle detection, and to analyze both flat and patterned samples for wafer damage. This image processing subsystem can be configured according to individual user needs, and is capable of identifying various defects, such as periodic, sustained, and random defects. MicRhoSense 6035 also features a laser scatter-array for high-speed, non-contact 3D mapping of the surface topography of the wafer. This allows for accurate measurements with very small noise levels for both planar textures and complex structured surfaces. This machine is also optimized for high throughput operation, with an estimated acquisition time of 50 seconds per sample. Finally, for productivity and ease of use, TENCOR MicRhoSense 6035 is compatible with automated ADE software platforms. These allow for easy integration and operation on a single platform, with software tools that feature advanced metrology algorithms for fast and accurate data analysis. These features, along with cost-effectiveness, ensure ADE / KLA / TENCOR MicRhoSense 6035 is a powerful yet user-friendly test and metrology solution for any wafer manufacturing needs.