Used ADE / KLA / TENCOR Microsense 6033 #9281712 for sale

ADE / KLA / TENCOR Microsense 6033
ID: 9281712
Wafer measurement system.
ADE / KLA / TENCOR Microsense 6033 is an advanced wafer testing and metrology equipment designed to provide precision analysis of wafer cut edges, post-etch lamination thicknesses, and coating thicknesses. The system includes a range of innovative features that allow for accurate testing across a wide range of sample sizes. ADE Microsense 6033 is equipped with a three-axis servo-controlled stage and a high-precision optical metrology unit. The metrology unit combines a white light interferometer, an ellipsometer, and a polarizometer to provide both absolute and relative measurements of sample thickness and layer thicknesses. The unit also features a Wafer Process Library to facilitate repeatability and traceability of measurements. The servo-controlled stage allows for a wide range of automated testing such as measuring wafer cut edges, post-etch lamination thicknesses, and coating thicknesses. The machine also supports advanced automated testing such as plating thickness, adhesion strength, planarity, lamination, and surface texture. KLA Microsense 6033 is capable of measuring wafers as small as 100um and as large as 200mm with the highest degree of accuracy. Additional features include piece-by-piece or batching scanning, data collection, and data analysis via USB, GPIB, and RS-232 interfaces. The tool is also capable of producing graphical representation of measurements such as SPC charts and Gage Repeatibility and Reproducibility (GR&R) charts. TENCOR Microsense 6033 is designed to meet the toughest requirements of the semiconductor industry in terms of accuracy, speed, and reliability. The asset is also customizable for specific requirements of individual applications. The model can also be integrated with a variety of other ADE products such as the Wafer Verifier-32 and Wafer Verifier Pro. Microsense 6033 is an intuitive and powerful tool for measuring critical metrology parameters of modern semiconductor wafers. Its advanced features and automated testing make it an ideal equipment for production, process development, quality control, and research laboratories. For the most demanding jobs, ADE / KLA / TENCOR Microsense 6033 is the perfect solution for obtaining precise measurements with excellent repeatability.
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