Used ADE / KLA / TENCOR Microsense 6033 #9301382 for sale

ADE / KLA / TENCOR Microsense 6033 is a comprehensive system for materials characterization and automated metrology solutions in advanced wafer technology. The system consists of a laser interferometry-based scanner, a processing unit, and a series of additional accessories for controlling and measuring parameters for wafer testing. The laser interferometry scanner is specifically designed to deliver high-accuracy measurements with its patented high-resolution vector light sensors. It can quickly analyze a variety of topography data including step heights, surface roughness, and flatness. The processing unit contains two high-resolution image sensors, two digital signal processing (DSP) units, and two independent 16-bit arithmetic processors for enhanced data processing. It also has a four-channel digital image processor for real-time image analysis, and a memory storage capacity of up to 32GB. The additional accessories include a multi-stage telescoping head for easy height adjustment, a high-resolution color LCD display for data visualization, and a high-speed data transfer capability for fast data acquisition. To ensure accuracy and repeatability, the system utilizes a patented Multi-Pass Algorithm (MPA) in its software for automated data collection. The MPA compiles data from multiple passes in a single scan to ensure the highest accuracy. The optimized scan speed ensures rapid analysis without compromising the quality of the data. Additionally, the unit is designed with a number of features to protect the sample being tested, such as anti-vibration mounting feet and a special dust chamber to reduce the effect of dust on data. ADE Microsense 6033 has a range of applications, from characterizing semiconductor wafers to measuring surface contamination of any complex surface. It can also be used to measure the thickness of dielectric, gas, and liquid layers on substrates. With its high accuracy, fast scan speed, and advanced features, KLA Microsense 6033 is ideal for metrology testing and proven to be one of the most reliable wafer testing and metrology systems.