Used ADE / KLA / TENCOR Microsense 6033T #9272589 for sale

ADE / KLA / TENCOR Microsense 6033T equipment is a state-of-the-art wafer testing and metrology system designed for ultimate performance. This unit combines the integrated solutions of both ADE Acuity detector and KLA WaferMapper software platforms, allowing for greater speed and agility in wafer testing and comprehensive metrology results. ADE Microsense 6033T includes an advanced X-ray detector that is capable of capturing images up to 4K in resolution in an extremely short time. This machine features a variable exposure time and dynamic range setting, allowing for quick and accurate imaging and precise image manipulation. Even in the presence of high-background radiation, KLA Microsense 6033T's X-ray detector can achieve a dynamic range of up to 5000:1, enabling the capture of precise details even in the most challenging test environments. The tool is powered by TENCOR WaferMapper software, allowing for automated detection and measurement of surface features, particle count, void fraction, and other wafer parameters. This software is equipped with a suite of advanced analytics tools for fast and reliable analysis, allowing users to quickly identify potential defects and other issues during testing and metrology. The integrated ADE / KLA / TENCOR Acuity detectorADE WaferMapper asset is capable of performing indepth wafer mapping and die testing quickly and accurately. This model allows for comprehensive coverage of the entire wafer while also providing a highly detailed analysis of the individual die. It can be used to perform a wide range of wafer tests, including quick spectral mapping, X-ray mapping, topology mapping, and surface roughness and feature detection. TENCOR Microsense 6033T equipment is engineered to meet the demanding requirements of today's wafer test and metrology applications. With its robust imaging capabilities and comprehensive analysis tools, it is an ideal solution for fast and reliable wafer testing and metrology.