Used ADE / KLA / TENCOR Microsense 6033T #9281713 for sale

ADE / KLA / TENCOR Microsense 6033T is a wafer testing and metrology equipment that is designed to enable a high-level of precision and accuracy when measuring thin-film thickness and critical dimensions during wafer fabrication. The system provides high-resolution, non-destructive metrology of thin-film structures across the entire wafer surface without the need for additional, costly optical microscopes. This allows for more reliable and faster wafer testing and measurement, ultimately improving the yields and productivity of the wafer fabrication process. The unit is built on a hardened, closed-loop auto-capable platform that ensures quick and accurate implementation of the latest measuring techniques. The machine combines high optical resolution and a digital image processor in order to provide detailed maps of topographic dimensions on the wafer's surface. This allows for precise visualization and analysis of even the smallest features and allows for fast and accurate measurements. The tool is equipped with two signal beams and two detector arrays for maximum definition and accuracy while measuring across a wide relative range of substrate materials and applications. The combined signal beams and detector arrays allow for over 10,000 measurements/second. This makes it an ideal metrology tool for advanced ICs and WLP structures. With on-board software for monitoring performance and detecting malfunctions, the asset can continuously monitor its own performance and make corrections as needed to ensure accurate throughput. ADE Microsense 6033T is also built with a number of user-friendly features that allow for easy setup and operation. This includes an automated alignment routine to ensure accurate pointing of the model's sensors and a simple GUI-based operator interface. It also comes with a number of different modes, such as area-scan, scan translation, edge-trace, and line-trace. These provide flexibility and speed up cycle time testing and measurement. Overall, KLA Microsense 6033T from ADE is a high-precision wafer testing and metrology equipment that is designed for fast, accurate, and reliable testing and measurements of thin-film structures on the wafer surface. This system offers a great combination of speed, accuracy, and flexibility, making it an ideal choice for a range of wafer fabrication applications.