Used ADE / KLA / TENCOR Microsense 6033T #9301386 for sale

ADE / KLA / TENCOR Microsense 6033T is a wafer testing and metrology equipment specifically designed for advanced semiconductor device fabrication, allowing users to make fast engineering decisions based on reliable results. This system features high throughput and accuracy, with a scanning speed of over 6000 wafers per hour. The Microsense also offers full automation, allowing operators to program routine procedures and process control settings. This unit utilizes a chromatic confocal imaging sensor, which allows for better focus accuracy and higher resolution than other comparable systems. It also utilizes top-side camera technology to detect surface defects on the sample wafer. ADE Microsense 6033T can detect various types of defects such as particles, dislocations, cracks, contaminants, etch pits, and accelerated life test defects, among others. In addition, the machine supports wafer thickness measurement through a capacitive sensor. The sensor accurately detects wafer thickness with a range of 0.5mm to 25mm, allowing users to ensure their wafers adhere to their specifications. Lastly, KLA Microsense 6033T features an intuitive graphical user interface to allow for easy tool navigation and processing control. From the main menu, users can quickly view data, generate reports, and analyze results. Furthermore, it allows for user-defined process control settings and report generation for fast data processing and analysis. Overall, TENCOR Microsense 6033T is an advanced wafer testing and metrology asset designed to streamline the device fabrication process. It provides accurate and detailed data about a range of possible defects, ensuring users that the quality of their wafers are upheld. Its automated settings and graphical user interface make this model a convenient and reliable solution for wafer testing and metrology.