Used ADE / KLA / TENCOR UltraScan 9300 #9101898 for sale

ADE / KLA / TENCOR UltraScan 9300 is a wafer testing and metrology equipment designed to deliver high accuracy and throughput for wafer manufacturing. Using its Contactless Non-Inductive Scanning (CNIS) technology, this system quickly scans complete wafer surfaces in a single pass, providing wafer metrology that is rapid, and repeatable. The laser-based scanning unit enables measurement of wafer parameters such as frontside or backside topography, reference flat, bump height, and patterned features across a full wafer surface. By combining rapid measurement speeds with reduced damage and vibration to the wafer surface, ADE UltraScan 9300 provides the accuracy and repeatability needed in semiconductor manufacturing. KLA ULTRA SCAN 9300 employs a number of patented features to ensure accuracy and repeatability. Its vertical stages allow for precise measurement across the entire wafer, and their high scanning speeds enable rapid cycle time. The CNIS scanning machine uses an optical microscope mounted on a Flexstage to scan the wafer without contacting it, ensuring high accuracy without damaging the wafer surface. The laser-based scanning tool eliminates vibration and motion artifacts that impair measurement accuracy. UltraScan 9300 also offers integrated process control and data analysis, making it an ideal asset for wafer manufacturing. The model tracks tool performance to ensure repeatable results across production. Data Analysis capabilities enable predictive maintenance, wafer and defect maps, defect trend analyses, and process yields. It also supports a range of algorithms and statistical techniques. In addition to its comprehensive set of onboard measurement and metrology tools, ADE / KLA / TENCOR ULTRA SCAN 9300 includes software for user-friendly operation. The software is user-configurable, and can be tailored for specific wafers or production settings. It also includes tools for data reading and analysis, global settings, and for logging and plotting results. ULTRA SCAN 9300 is the perfect equipment for wafer testing and metrology, providing accurate and repeatable results with high throughput. Its advanced CNIS scanning, integrated process control, and configurable software make it an ideal tool for semiconductor manufacturing.