Used ADE / KLA / TENCOR UltraScan 9600 #293604005 for sale

ADE / KLA / TENCOR UltraScan 9600
ID: 293604005
Wafer metrology system.
ADE / KLA / TENCOR UltraScan 9600 is an advanced wafer testing and metrology equipment designed to measure and analyze the electrical characteristics of integrated circuits. The system is equipped with a digital microscope, capable of magnifications up to 25x and capturing images with 500x500 resolution. Additionally, it incorporates a high-speed laser interferometer for accuracy of repeatability and linearity up to 10 nanometers. In addition to digital imaging, ADE UltraScan 9600 also provides detailed measurements of circuit properties including electrical characteristics suchas resistance, capacitance, leakage current, and breakdown voltage. This is enabled by high-end scanning techniques such as capacitance equivalent model scanning, double line scanning, and high speed scanning. The scan area and test points are configurable to allow flexibility when testing large or special sized wafers. The unit is capable of cutting-edge wafer level test & measurement, as well as complete failure analysis and characterization. Its advanced analysis capabilities allow it to quickly identify areas of failure, validate device designs, and generate detailed defect reports. These reports provide comprehensive data that can be used to investigate and optimize yields, which in turn can dramatically improve the efficiency of the manufacturing process. The machine also features a powerful and easy-to-use software interface. This interface is used to reveal data from the test suite and to transfer the data from the tool to other sources. The operating asset is Windows-based, making it easy to utilize existing software for more detailed analysis. KLA ULTRA SCAN 9600 is an advanced and versatile wafer testing and metrology model,invaluable in ensuring the quality and efficiency of themanufacturing process. With such a wide-range of capabilities it promises to be a reliable tool in meeting and exceeding quality control standards.
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