Used ADE / KLA / TENCOR WaferCheck 7000 #9240724 for sale

ADE / KLA / TENCOR WaferCheck 7000 is an advanced wafer testing and metrology equipment developed for manufacturers looking for a high level of accuracy and efficiency. ADE WaferCheck 7000 is specifically designed for testing and measuring the electrical properties of wafer substrates, such as on-wafer capacitance, inductance, and resistance. KLA WaferCheck 7000 utilizes a sophisticated vision system which allows for efficient, accurate pattern inspection of the wafers. By simultaneously capturing high resolution images and 3-dimensional data, it can measure features as small as 1 micron with an accuracy of +/- 3 microns. The unit is capable of inspecting both standard and customized wafer geometry, such as stepped substrates and flat configurations. TENCOR WaferCheck 7000 incorporates various electrical testing and metrology tools, each with an automated calibration machine. The tool is equipped with a high speed AFM/STM which measures junction capacitance, inductance, resistance, and warp. It has an automated electrical probe station for precise electrical testing of transistors, diodes, passive devices, and other components. WaferCheck 7000 also includes a comprehensive analysis package for defect analysis and yield analysis. This high performance vision asset has 3-dimensional data capture with a maximum sample rate of 45 million points per second. ADE / KLA / TENCOR WaferCheck 7000 is ideal for semiconductor manufacturers and fabricators who need to quickly and accurately inspect wafers. It offers a fast, robust, and reliable model that will improve process times and product quality, ensuring efficient and reliable outcomes.