Used ADE / KLA / TENCOR WaferSight PWG2 #9283347 for sale

ADE / KLA / TENCOR WaferSight PWG2 is a state-of-the-art automated wafer testing and metrology equipment designed to maximize yield and reduce costs. It's a powerful system for imaging, measuring, and defect detection solutions, enabling fast and accurate results with minimal manual labor. The automated wafer testing and metrology unit consists of an optical microscope and an image acquisition machine to collect optical images of the wafers and its structures, together with a laser metrology tool for fast dimensional measurements. The microscope includes a variety of objective lenses to capture the wafer's surface features, including grains, defects, and other topographical features. The image acquisition asset is comprised of two laser sensors and two light-sensitive chips, which measure extents of optical reflectance for accurate data acquisition. The model also includes a high-level pattern recognition neural network processor, which automatically inspects wafers for defects, using a cascade of algorithms. The neural network processor is able to accurately identify a wide range of defect sizes and locations. It is also capable of providing an extensive inspection database for each wafer, which can be used to assess product yields. The laser metrology equipment of ADE WaferSight PWG2 also covers a wide range of critical dimensions, with resolution levels twice that of traditional light microscopes. It is also able to measure exact dimensions of hard-to-read structures such as sub-pixel feature edges, via a "digital replicator" feature, which accurately measures such features with sub-micron accuracy. The automated system is extremely reliable, with an uptime of up to 99.7%, ensuring consistent results as part of its overall robustness. It is also extremely easy to operate, requiring minimal manual intervention to set up, operate, and monitor. The software provides an easy-to-use graphical interface to set up experiments, view imaging and metrology results, and export the data for further analysis. In conclusion, KLA WaferSight PWG2 is a powerful and reliable automated wafer testing and metrology unit, designed to automate routine image acquisition and measurement processes. Its extraordinary accuracy, combined with its low-cost and minimal manual labor operation, make this machine an ideal solution for cost-effective testing and metrology.