Used ADE / KLA / TENCOR WaferSight #9235753 for sale

ADE / KLA / TENCOR WaferSight is an advanced in-line wafer testing and metrology system based on patented white light interferometry (WLI) technology. ADE WaferSight is a cost-effective non-destructive wafer testing solution capable of measuring all types of surfaces - from macro features to nanoscale depths. The innovative design of the system allows for reduced cycle times and improved quality control, providing at-wafer defect detection and characterization capabilities. KLA WaferSight's automated setup enables it to quickly adapt to wafers of a wide range of sizes, materials, and geometries, allowing for faster characterization of both process defects and global phenomena. Additionally, it offers in-line wafer testing for both statistical and min/max values - from within-die to across-wafer measurements. The integrated optics in WaferSight allow for high precision 3D measurements of the wafer surface. The optics also enable application of variable trace sampling across a given surface, allowing for detection of non-uniformities and detailed surface characterization. This results in enhanced wafer-level defect detection and analysis, along with accurate 3D and profile measurement of topography. Using optical diffraction, TENCOR WaferSight can also measure surface and feature characteristics of CD, width, and flatness. Additionally, ADE / KLA / TENCOR WaferSight can be used for analytical purposes such as overlay metrology, defect trend profile analysis, and process uniformity monitoring. ADE WaferSight's software can be customized to meet customer needs, offering full integration with process control software and integration to automation. Visualization and reporting options are available in a real-time web browser, PDF format, or via an external report generator, while a host of data analysis techniques are available for further data optimization. In summary, KLA WaferSight is an in-line wafer testing and metrology system offering rapid and reliable measurements suitable for detailed surface characterization, accurate 3D and profile topography measurements, and process control. It is further customizable and provides cost-effective performance, making it an ideal choice for process monitoring and defect detection in semiconductor manufacturing.