Used AMAT / APPLIED MATERIALS VeraSEM #9130176 for sale

ID: 9130176
Wafer Size: 12"
System, 12".
AMAT / APPLIED MATERIALS VeraSEM is a wafer testing and metrology equipment that allows for high accuracy and repeatability in automated wafer testing and measurement processes. The system incorporates a high-precision scanning electron microscope, which is capable of achieving 0.5nm accuracy in navigation, as well as a wide range of measurement capabilities that cover all stages of device fabrication. In addition, the unit uses an advanced optical recognition machine to identify devices, active regions, and defects on the wafer. This allows for precise and coordinated measurement of characteristics such as surface morphology and composition, defects, film thickness, overlay registration, and doping profiles. AMAT VeraSEM also features an automated wafer handling tool that ensures wafer stability during testing. The asset is capable of handling wafers of different shapes, sizes, and orientations, ensuring that the orientation of the wafer is maintained during testing. Additionally, the model provides a range of metrology tools to measure device properties such as line width, overlay accuracy, and thickness, as well as imaging capabilities for viewing and analyzing nanoscale objects on the wafer. The equipment also incorporates two integrated eddy current measurement technologies, allowing for fast and accurate measurements of thin film thicknesses, metal film stress, and metal line resistivity. This makes it possible to identify and measure metal layers on thin films and devices with greater accuracy. Finally, APPLIED MATERIALS VeraSEM is supported by an intuitive user interface and comprehensive software, which simplifies data collection and analysis. This allows users to easily create and customize jobs and creates comprehensive reports with detailed data analysis. In addition, the system can be integrated with other systems and devices, such as discriminators, making it ideal for testing multiple different devices simultaneously.
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