Used AMAT / APPLIED MATERIALS VeraSem for sale

Wafer Testing And Metrology

Manufacturer

AMAT / APPLIED MATERIALS

Model

VeraSem

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4 results

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Critical Dimension Scanning Electron Microscope (CD-SEM), 12" 2002 vintage.

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3D Scanning electron microscope (SEM), 8" Wafer shape: SNNF PP Miraial, 8" No SMIF interface Electr

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Critical Dimension Scanning Electron Microscope (CD-SEM), 8".

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System, 12".