Used AMAT / APPLIED MATERIALS VeraSEM #9236866 for sale

AMAT / APPLIED MATERIALS VeraSEM is a complete wafer testing and metrology solution designed to meet the needs of advanced memory fabrication processes. Featuring a powerful imaging, analysis and calibration capabilities, AMAT VeraSEM can easily be integrated into existing production line environments. APPLIED MATERIALS VeraSEM utilizes advanced spectroscopic imaging technology for ultra-high sensitivity, providing fast measurements and quick results. The advanced platform enables accurate, real-time data collection with wafers located on the sample stage. VeraSEM delivers superior detection and analysis of particles, nano-particles, defects, and z-height characteristics through the examination of both 2D and 3D cross-sections of the material. The equipment employs an enhanced thermocoherent scanning electron microscope (ThermoSTEM) that captures and processes millions of data points over a wide range of wafer geometries. The analysis offers exceptional sensitivity to materials, surface conductivity, grain key, orientations, and other critical parameters. Crystal structure imaging is enabled by the customizable 200-2500V accelerating voltage range and 40-80 nA current range of AMAT / APPLIED MATERIALS VeraSEM. The wafer mapping capabilities of AMAT VeraSEM facilitate comprehensive testing of smaller devices by mapping multiple sensing points or target areas across the wafer for simultaneous measurements using its dual-position sample stage. Magnification levels up to 50kX and high-resolution imaging capabilities provide resolution of up to 0.2nm. The operations can be remotely monitored from a central control station, with an on-board data storage system for archiving image data. In addition to the core operations of APPLIED MATERIALS VeraSEM, a full suite of software solutions are available to facilitate the management, optimization, and data analysis operations for the wafer testing. Using the Unit Manager software, users can access multiple resources throughout the networked environment with secure authentication. All of the automated measurement operations such as defect intelligence, particle sizing, wafer symmetry, and geometrical analysis are performed with support of the Advanced Metrology Suite. The machine also includes secure data backup and archival solutions to provide the foundational compliance with industry quality standards. In conclusion, VeraSEM by AMAT offers an excellent solution for advanced wafer testing and metrology. A combination of powerful imaging, analysis and calibration capabilities, support for remote monitoring, secure authentication and data storage, and on-board software for data optimization facilitate the streamlined integration of the platform into various production line environments.