Used BRUKER Contour GT-X8 #9399868 for sale

BRUKER Contour GT-X8 is a state-of-the-art wafer testing and metrology equipment designed to meet the most demanding requirements of semiconductor device characterization. It offers an extensive set of tools allowing characterization of a wide range of materials, device structures and geometries. The system is equipped with a large working area with a highly accurate and repeatable 10nm pitch stepper stage along with a non-contact optical surface profilometer and height sensor for 3D topography measurements. Contour GT-X8 provides fast and high precision step-and-scan measurement of nanoscale critical dimensions (CD) on semiconductor devices. The high throughput operation ensures efficient characterization of even the most complex structures. BRUKER Contour GT-X8 utilizes a range of advanced imaging and measurement technologies, including scatterometry, optical interference microscopy, terahertz spectroscopy, and acoustic microscopy to provide full characterization of device structures. Various physical and electrical parameters can be measured in situ including sheet resistance, surface flatness, thickness, deposition rate, surface roughness, nanostructure profile and material composition. Contour GT-X8 can be integrated with other tools, such as atomic force microscopy, ellipsometry and nano-indentation, to provides additional characterization capabilities. In addition, the unit can be connected to a high performance computer for data analysis and visualization. The machine also features user-friendly software for automated set-up and data collection. The intuitive interface allows for accurate parameter settings and advanced data management. The tool's advanced analytics capabilities can be used to review and compare data from different scans to ensure data accuracy and repeatability. Overall, BRUKER Contour GT-X8 provides a fully integrated platform for reliable, accurate and non-destructive characterization of nanostructures. The asset's advanced capabilities for imaging, measuring and analyzing nanoscale structures make it an essential tool for research and development in the semiconductor industry.